Simulation of gas avalanche in a micro pixel chamber using Garfield++

A. Takada, T. Tanimori, H. Kubo, J. D. Parker, T. Mizumoto, Y. Mizumura, S. Iwaki, T. Sawano, K. Nakamura, K. Taniue, N. Higashi, Y. Matsuoka, S. Komura, Y. Sato, S. Namamura, M. Oda, S. Sonoda, D. Tomono, K. Miuchi, S. KabukiY. Kishimoto, S. Kurosawa

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

A micro pixel chamber (μ-PIC), the development of which started in 2000 as a type of a micro pattern gas detector, has a high gas gain greater than 6000 in stable operation, a large detection area of 900 cm2, and a fine position resolution of about 120 μm. However, for its development, simulation verification has not been very useful, because conventional simulations explain only part of the experimental data. On the other hand, some μ-PIC applications require precise understanding of the fluctuation of the gas avalanche and signal waveform for their improvement; therefore, there is a need to update the μ-PIC simulation. Hence, we adopted Garfield++, which is developed for simulating a microscopic avalanche in an effort to explain experimental data. The simulated avalanche size was well consistent with the experimental gas gain. Moreover, we calculated a signal waveform and successfully explained the pulse height and time-over-threshold. These results clearly indicate that the simulation of μ-PIC applications will improve and that Garfield++ simulation will easily facilitate the μ-PIC development.

Original languageEnglish
Article numberC10023
JournalJournal of Instrumentation
Volume8
Issue number10
DOIs
Publication statusPublished - 2013 Oct

Keywords

  • Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)
  • Gaseous detectors
  • Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc); Time projection Chambers (TPC)

ASJC Scopus subject areas

  • Mathematical Physics
  • Instrumentation

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