Simulation of atomic force microscopy images of cleaved mica surfaces

Kazuya Tsujimichi, Hiroyuki Tamura, Akiyasu Hirotani, Momoji Kubo, Masaharu Komiyama, Akira Miyamoto

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH)4 tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions. Imaging of the individual oxygen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica surface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were interpreted in terms of the present simulation results.

Original languageEnglish
Pages (from-to)4260-4264
Number of pages5
JournalJournal of Physical Chemistry B
Volume101
Issue number21
Publication statusPublished - 1997 May 22

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

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  • Cite this

    Tsujimichi, K., Tamura, H., Hirotani, A., Kubo, M., Komiyama, M., & Miyamoto, A. (1997). Simulation of atomic force microscopy images of cleaved mica surfaces. Journal of Physical Chemistry B, 101(21), 4260-4264.