Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH)4 tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions. Imaging of the individual oxygen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica surface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were interpreted in terms of the present simulation results.
|Number of pages||5|
|Journal||Journal of Physical Chemistry B|
|Publication status||Published - 1997 May 22|
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films
- Materials Chemistry