Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots

Masaharu Komiyama, Katsuyuki Tazawa, Kazuya Tsujimichi, Akiyasu Hirotani, Momoji Kubo, Akira Miyamoto

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined.

Original languageEnglish
Pages (from-to)580-583
Number of pages4
JournalThin Solid Films
Volume281-282
Issue number1-2
DOIs
Publication statusPublished - 1996 Aug 1

Keywords

  • Atomic force microscopy (AFM)
  • Metals
  • Nanostructures
  • Surface structure

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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