Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots

Masaharu Komiyama; Katsuyuki Tazawa; Kazuya Tsujimichi; Akiyasu Hirotani; Momoji Kubo; Akira Miyamoto

doi:10.1016/0040-6090(96)08714-7

Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots

Masaharu Komiyama, Katsuyuki Tazawa, Kazuya Tsujimichi, Akiyasu Hirotani, Momoji Kubo, Akira Miyamoto

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined.

Original language	English
Pages (from-to)	580-583
Number of pages	4
Journal	Thin Solid Films
Volume	281-282
Issue number	1-2
DOIs	https://doi.org/10.1016/0040-6090(96)08714-7
Publication status	Published - 1996 Aug 1

Keywords

Atomic force microscopy (AFM)
Metals
Nanostructures
Surface structure

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/0040-6090(96)08714-7

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@article{9e7147d2c5e248e798a83027b97b5edd,

title = "Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots",

abstract = "Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined.",

keywords = "Atomic force microscopy (AFM), Metals, Nanostructures, Surface structure",

author = "Masaharu Komiyama and Katsuyuki Tazawa and Kazuya Tsujimichi and Akiyasu Hirotani and Momoji Kubo and Akira Miyamoto",

year = "1996",

month = aug,

day = "1",

doi = "10.1016/0040-6090(96)08714-7",

language = "English",

volume = "281-282",

pages = "580--583",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Simulation of atomic force microscopy image variations due to tip apex size

T2 - Appearance of half spots

AU - Komiyama, Masaharu

AU - Tazawa, Katsuyuki

AU - Tsujimichi, Kazuya

AU - Hirotani, Akiyasu

AU - Kubo, Momoji

AU - Miyamoto, Akira

PY - 1996/8/1

Y1 - 1996/8/1

N2 - Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined.

AB - Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined.

KW - Atomic force microscopy (AFM)

KW - Metals

KW - Nanostructures

KW - Surface structure

UR - http://www.scopus.com/inward/record.url?scp=13544270391&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=13544270391&partnerID=8YFLogxK

U2 - 10.1016/0040-6090(96)08714-7

DO - 10.1016/0040-6090(96)08714-7

M3 - Article

AN - SCOPUS:13544270391

VL - 281-282

SP - 580

EP - 583

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 1-2

ER -