Simulation of atomic force microscopy image variations along the surface normal: Presence of possible resolution limit in the attractive force range

Masaharu Komiyama, Kazuya Tsujimichi, Shin’Ya Ohkubo, Katsuyuki Tazawa, Momoji Kubo, Akira Miyamoto

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17 Citations (Scopus)

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Engineering & Materials Science

Physics & Astronomy