Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging

Masaharu Komiyama, Kazuya Tsujimichi, Katsuyuki Tazawa, Akiyasu Hirotani, Hideo Yamano, Momoji Kubo, Ewa Broclawik, Akira Miyamoto

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.

Original languageEnglish
Pages (from-to)222-227
Number of pages6
JournalSurface Science
Volume357-358
DOIs
Publication statusPublished - 1996 Jun 20

Keywords

  • Atom-solid interactions
  • Atomic force microscopy
  • Copper
  • Molecular dynamics
  • Surface relaxation and reconstruction
  • Surface structure, morphology, roughness, and topography

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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