Simulating atomic resolution STEM images of non-periodic samples

S. D. Findlay, A. J. D'Alfonso, L. J. Allen, M. P. Oxley, P. D. Nellist, E. C. Cosgriff, G. Behan, A. Kirkland, N. Shibata, T. Mizoguchi, Yuichi Ikuhara

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)928-929
    Number of pages2
    JournalMicroscopy and Microanalysis
    Issue numberSUPPL. 2
    Publication statusPublished - 2008 Aug 1

    ASJC Scopus subject areas

    • Instrumentation

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