Simulating atomic resolution STEM images of non-periodic samples

S. D. Findlay, A. J. D'Alfonso, L. J. Allen, M. P. Oxley, P. D. Nellist, E. C. Cosgriff, G. Behan, A. Kirkland, N. Shibata, T. Mizoguchi, Yuichi Ikuhara

    Research output: Contribution to journalArticle

    Original languageEnglish
    Pages (from-to)928-929
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume14
    Issue numberSUPPL. 2
    DOIs
    Publication statusPublished - 2008 Aug 1

    ASJC Scopus subject areas

    • Instrumentation

    Cite this

    Findlay, S. D., D'Alfonso, A. J., Allen, L. J., Oxley, M. P., Nellist, P. D., Cosgriff, E. C., Behan, G., Kirkland, A., Shibata, N., Mizoguchi, T., & Ikuhara, Y. (2008). Simulating atomic resolution STEM images of non-periodic samples. Microscopy and Microanalysis, 14(SUPPL. 2), 928-929. https://doi.org/10.1017/S1431927608084080