Simple scanning phase-contrast X-ray tomography using intensity detectors

Hidekazu Takano, Sho Shimomura, Shigeki Konishi, Hiroaki Azuma, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


We have developed a phase-contrast X-ray microtomography system based on scanning microscopy with X-ray focusing optics. The system is very simple because only two conventional intensity detectors and a half-obstructing-plate for the second detector are installed into the conventional scanning microscopy setup. We constructed the system with a 450-nm-size focused beam of a 10 keV X-ray. The system is operated with a sampling rate of 100 Hz. Adopting data correction using a guide object and data interpolation procedure in sinograms, tomographic reconstruction images with a high spatial resolution and phase sensitivity are obtained.

Original languageEnglish
Article number040204
JournalJapanese journal of applied physics
Issue number4 PART 1
Publication statusPublished - 2013 Apr 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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