Sign reversal of transformation entropy change in Co2Cr(Ga,Si) shape memory alloys

Xiao Xu, Toshihiro Omori, Makoto Nagasako, Takeshi Kanomata, Ryosuke Kainuma

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


In situ X-ray diffraction (XRD) measurements and compression tests were performed on Co2Cr(Ga,Si) shape memory alloys. The reentrant martensitic transformation behavior was directly observed during the in situ XRD measurements. The high-temperature parent phase and low-temperature reentrant parent phase were found to have a continuous temperature dependence of lattice parameter, therefore suggesting that they are the same phase in nature. Moreover, compression tests were performed on a parent-phase single crystal sample; an evolution from normal to inverse temperature dependence of critical stress for martensitic transformation was directly observed. Based on the Clausius-Clapeyron analysis, a sign reversal of entropy change can be expected on the same alloy.

Original languageEnglish
Article number181904
JournalApplied Physics Letters
Issue number18
Publication statusPublished - 2015 Nov 2

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Sign reversal of transformation entropy change in Co<sub>2</sub>Cr(Ga,Si) shape memory alloys'. Together they form a unique fingerprint.

Cite this