SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs

Makoto Miura; Hiromi Shimamoto; Reiko Hayami; Akihiro Kodama; Tatsuya Tominari; Takashi Hashimoto; Katsuyoshi Washio

doi:10.1109/istdm.2006.246542

SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs

Makoto Miura, Hiromi Shimamoto, Reiko Hayami, Akihiro Kodama, Tatsuya Tominari, Takashi Hashimoto, Katsuyoshi Washio

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Publisher	IEEE Computer Society
ISBN (Print)	1424404614, 9781424404612
DOIs	https://doi.org/10.1109/istdm.2006.246542
Publication status	Published - 2006 Jan 1
Externally published	Yes
Event	Third International SiGe Technology and Device Meeting, ISTDM 2006 - Princeton, NJ, United States Duration: 2006 May 15 → 2006 May 17

Publication series

Name	Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Volume	2006

Other

Other	Third International SiGe Technology and Device Meeting, ISTDM 2006
Country/Territory	United States
City	Princeton, NJ
Period	06/5/15 → 06/5/17

ASJC Scopus subject areas

Computer Science(all)
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

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10.1109/istdm.2006.246542

Cite this

Miura, M., Shimamoto, H., Hayami, R., Kodama, A., Tominari, T., Hashimoto, T., & Washio, K. (2006). SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs. In Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest [1716036] (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest; Vol. 2006). IEEE Computer Society. https://doi.org/10.1109/istdm.2006.246542

SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs. / Miura, Makoto; Shimamoto, Hiromi; Hayami, Reiko; Kodama, Akihiro; Tominari, Tatsuya; Hashimoto, Takashi; Washio, Katsuyoshi.

Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. IEEE Computer Society, 2006. 1716036 (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest; Vol. 2006).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Miura, M, Shimamoto, H, Hayami, R, Kodama, A, Tominari, T, Hashimoto, T & Washio, K 2006, SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs. in Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest., 1716036, Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest, vol. 2006, IEEE Computer Society, Third International SiGe Technology and Device Meeting, ISTDM 2006, Princeton, NJ, United States, 06/5/15. https://doi.org/10.1109/istdm.2006.246542

Miura M, Shimamoto H, Hayami R, Kodama A, Tominari T, Hashimoto T et al. SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs. In Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. IEEE Computer Society. 2006. 1716036. (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest). https://doi.org/10.1109/istdm.2006.246542

Miura, Makoto ; Shimamoto, Hiromi ; Hayami, Reiko ; Kodama, Akihiro ; Tominari, Tatsuya ; Hashimoto, Takashi ; Washio, Katsuyoshi. / SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs. Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. IEEE Computer Society, 2006. (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest).

@inproceedings{2e2e82493b804e84a2ae447f5fc4b1fd,

title = "SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs",

author = "Makoto Miura and Hiromi Shimamoto and Reiko Hayami and Akihiro Kodama and Tatsuya Tominari and Takashi Hashimoto and Katsuyoshi Washio",

year = "2006",

month = jan,

day = "1",

doi = "10.1109/istdm.2006.246542",

language = "English",

isbn = "1424404614",

series = "Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest",

publisher = "IEEE Computer Society",

booktitle = "Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest",

note = "Third International SiGe Technology and Device Meeting, ISTDM 2006 ; Conference date: 15-05-2006 Through 17-05-2006",

}

TY - GEN

T1 - SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs

AU - Miura, Makoto

AU - Shimamoto, Hiromi

AU - Hayami, Reiko

AU - Kodama, Akihiro

AU - Tominari, Tatsuya

AU - Hashimoto, Takashi

AU - Washio, Katsuyoshi

PY - 2006/1/1

Y1 - 2006/1/1

UR - http://www.scopus.com/inward/record.url?scp=34247530887&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34247530887&partnerID=8YFLogxK

U2 - 10.1109/istdm.2006.246542

DO - 10.1109/istdm.2006.246542

M3 - Conference contribution

AN - SCOPUS:34247530887

SN - 1424404614

SN - 9781424404612

T3 - Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest

BT - Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest

PB - IEEE Computer Society

T2 - Third International SiGe Technology and Device Meeting, ISTDM 2006

Y2 - 15 May 2006 through 17 May 2006

ER -

SiGe BiCMOS technologies for improving sensitivity and high-speed characteristics of the communication LSIs

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ASJC Scopus subject areas

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