Si multiprobes integrated with lateral actuators for independent scanning probe applications

Yoomin Ahn, Takahito Ono, Masayoshi Esashi

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

Silicon SPM multiprobes having lateral actuators with a very small pitch were microfabricated and evaluated for independent parallel operations and nanomaterial characterizations. Two types of 1 × 4 probe array were developed. In order to treat smaller objects, the distance between each cantilever tip was produced to be as small as possible. The inter-tip distance is about 7 νm. In addition, the cantilevers of the multiprobes had comb drive actuators that enable individual probes to move horizontally. More flexibility in SPM operation was obtained with these individual self-movement probes possibly opening up new applications in nanotechnology. Using the microfabricated multiprobes, the characterization of the electric properties of a carbon nanotube by a two-probe measurement and the manipulation of a microlens were demonstrated.

Original languageEnglish
Pages (from-to)1224-1229
Number of pages6
JournalJournal of Micromechanics and Microengineering
Volume15
Issue number6
DOIs
Publication statusPublished - 2005 Jun 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Si multiprobes integrated with lateral actuators for independent scanning probe applications'. Together they form a unique fingerprint.

Cite this