TY - JOUR
T1 - Short time measurements of full-solid-angle Auger electron diffraction using a 180° deflection toroidal analyzer
AU - Shiraki, Susumu
AU - Ishii, Hideshi
AU - Owari, Masanori
AU - Nihei, Yoshimasa
N1 - Funding Information:
This work is supported by Research for the Future Program of Japan Society for the Promotion of Science (Project No. JSPS-RFTF 98R14101). We would like to thank Doctor Shinji Omori for supplying the theoretical calculation program used in this work. We also acknowledge Professor Tetsuo Sakamoto for helpful suggestions about making the high-voltage power-supply-unit.
PY - 2001/3
Y1 - 2001/3
N2 - We have developed a 180° deflection toroidal analyzer for photo- and Auger electron diffraction. Due to the simultaneous registration of the wide range of polar angles in a given azimuth of the sample, measurements of photo- and Auger electron intensities over π steradians can be performed rapidly by azimuthal rotation of the sample. In order to obtain the Auger electron diffraction data, it was necessary to measure the accurate energy distribution on the detector. Thus, we have constructed a newly designed input-lens-system, so that the energy resolution of the analyzer has been improved. Using this analyzer, some examples of full-solid-angle Auger electron diffraction (AED) patterns measured in short acquisition times were presented. The AED patterns obtained were compared with theoretical ones calculated by the multiple-scattering scheme.
AB - We have developed a 180° deflection toroidal analyzer for photo- and Auger electron diffraction. Due to the simultaneous registration of the wide range of polar angles in a given azimuth of the sample, measurements of photo- and Auger electron intensities over π steradians can be performed rapidly by azimuthal rotation of the sample. In order to obtain the Auger electron diffraction data, it was necessary to measure the accurate energy distribution on the detector. Thus, we have constructed a newly designed input-lens-system, so that the energy resolution of the analyzer has been improved. Using this analyzer, some examples of full-solid-angle Auger electron diffraction (AED) patterns measured in short acquisition times were presented. The AED patterns obtained were compared with theoretical ones calculated by the multiple-scattering scheme.
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U2 - 10.1016/S0368-2048(00)00390-X
DO - 10.1016/S0368-2048(00)00390-X
M3 - Conference article
AN - SCOPUS:0035276140
VL - 114-116
SP - 1049
EP - 1054
JO - Journal of Electron Spectroscopy and Related Phenomena
JF - Journal of Electron Spectroscopy and Related Phenomena
SN - 0368-2048
T2 - 8th International Conference on Electronic Spectroscopy and Structure (ICESS-8)
Y2 - 8 August 2000 through 12 August 2000
ER -