Short time measurements of full-solid-angle Auger electron diffraction using a 180° deflection toroidal analyzer

Susumu Shiraki, Hideshi Ishii, Masanori Owari, Yoshimasa Nihei

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    We have developed a 180° deflection toroidal analyzer for photo- and Auger electron diffraction. Due to the simultaneous registration of the wide range of polar angles in a given azimuth of the sample, measurements of photo- and Auger electron intensities over π steradians can be performed rapidly by azimuthal rotation of the sample. In order to obtain the Auger electron diffraction data, it was necessary to measure the accurate energy distribution on the detector. Thus, we have constructed a newly designed input-lens-system, so that the energy resolution of the analyzer has been improved. Using this analyzer, some examples of full-solid-angle Auger electron diffraction (AED) patterns measured in short acquisition times were presented. The AED patterns obtained were compared with theoretical ones calculated by the multiple-scattering scheme.

    Original languageEnglish
    Pages (from-to)1049-1054
    Number of pages6
    JournalJournal of Electron Spectroscopy and Related Phenomena
    Volume114-116
    DOIs
    Publication statusPublished - 2001 Mar
    Event8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA
    Duration: 2000 Aug 82000 Aug 12

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Radiation
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Spectroscopy
    • Physical and Theoretical Chemistry

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