Shape of the cantilever deflection for the atomic force microscope in force curve measurements

Minoru Sasaki, Kazuhiro Hane, Shigeru Okuma, Yoshinori Bessho

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

The lateral force induces a torsional motion in the cantilever for an atomic force microscope. This phenomenon affects not only the surface image but also the force curve. The two-dimensional deflections of the cantilever under several force curve measurement conditions are investigated using the heterodyne interferometer. In most cases, the deflection agrees well with that obtained theoretically from linear static analysis. At some points on a rough sample surface, undesirable behaviors are seen in both force curve and two-dimensional deflection of the cantilever. The relation between the force curve and the deflection of the cantilever is investigated in detail experimentally and theoretically.

Original languageEnglish
Pages (from-to)1930-1934
Number of pages5
JournalReview of Scientific Instruments
Volume65
Issue number6
DOIs
Publication statusPublished - 1994 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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