Sensitivity of x-ray phase tomography based on Talbot and Talbot-Lau interferometer

Atsushi Momose, Wataru Yashiro, Yoshihiro Takeda, Norihide Maikusa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

The sensitivity of X-ray phase tomography based on Talbot(-Lau) interferometry is discussed. A criterion is described to evaluate the superiority of the technique in comparison to the conventional absorption-contrast method. An experimental result of X-ray phase tomography with a Talbot interferometer is compared with the criterion. The advantage of X-ray phase tomography based on Talbot(-Lau) interferometry is more prominent when smaller structures are observed with smaller pixels.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography VI
DOIs
Publication statusPublished - 2008 Nov 21
Externally publishedYes
EventDevelopments in X-Ray Tomography VI - San Diego, CA, United States
Duration: 2008 Aug 122008 Aug 14

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7078
ISSN (Print)0277-786X

Other

OtherDevelopments in X-Ray Tomography VI
CountryUnited States
CitySan Diego, CA
Period08/8/1208/8/14

Keywords

  • Grating
  • Imaging
  • Phase
  • Sensitivity
  • Talbot interferometer
  • Tomography

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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