Sensitivity of X-ray phase imaging based on Talbot interferometry

Atsushi Momose, Wataru Yashiro, Yoshihiro Takeda

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The sensitivity of X-ray phase imaging based on Talbot interferometry is discussed. In order to evaluate the superiority of the technique to the conventional absorption-contrast method, which relies on X-ray absorption, a criterion is proposed. An experimental result of X-ray phase imaging with a Talbot interferometer is compared with the criterion. The criterion is also available for X-ray phase imaging based on Talbot-Lau interferometry. The advantage of X-ray phase imaging based on Talbot(-Lau) interferometry is more prominent when smaller structures are observed with smaller pixels.

Original languageEnglish
Pages (from-to)8077-8080
Number of pages4
JournalJapanese journal of applied physics
Volume47
Issue number10 PART 1
DOIs
Publication statusPublished - 2008 Oct 1
Externally publishedYes

Keywords

  • Grating
  • Sensitivity
  • Talbot interferometer
  • Talbot-Lau interferometer
  • X-ray phase contrast

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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