Sensitive Phonon-Based Probe for Structure Identification of 1T′ MoTe2

Lin Zhou, Shengxi Huang, Yuki Tatsumi, Lijun Wu, Huaihong Guo, Ya Qing Bie, Keiji Ueno, Teng Yang, Yimei Zhu, Jing Kong, Riichiro Saito, Mildred Dresselhaus

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

In this work, by combining transmission electron microscopy and polarized Raman spectroscopy for the 1T′ MoTe2 flakes with different thicknesses, we found that the polarization dependence of Raman intensity is given as a function of excitation laser wavelength, phonon symmetry, and phonon frequency, but has weak dependence on the flake thickness from few-layer to multilayer. In addition, the frequency of Raman peaks and the relative Raman intensity are sensitive to flake thickness, which manifests Raman spectroscopy as an effective probe for thickness of 1T′ MoTe2. Our work demonstrates that polarized Raman spectroscopy is a powerful and nondestructive method to quickly identify the crystal structure and thickness of 1T′ MoTe2 simultaneously, which opens up opportunities for the in situ probe of anisotropic properties and broad applications of this novel material.

Original languageEnglish
Pages (from-to)8396-8399
Number of pages4
JournalJournal of the American Chemical Society
Volume139
Issue number25
DOIs
Publication statusPublished - 2017 Jun 28

ASJC Scopus subject areas

  • Catalysis
  • Chemistry(all)
  • Biochemistry
  • Colloid and Surface Chemistry

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