Semi-direct method for surface structure analysis using correlated thermal diffuse scattering

T. Abukawa, S. Kono

Research output: Contribution to journalReview articlepeer-review

1 Citation (Scopus)

Abstract

The authors review the correlated thermal diffuse scattering (CTDS) as a semi-direct tool for surface structure analysis. The strong vibrational correlation between very near-neighbor atoms induces broad features in the thermal diffuse scattering of diffraction. The broad features, which were paid little attention in crystallography, are the subject of CTDS. Only the short-range arrangement of neighbor atoms is reflected in CTDS so that one can treat CTDS as a kinematical diffraction, even with surface-sensitive electron diffraction. Thus the surface structure is semi-directly obtained by means of the kinematical analysis based on the Fourier transformation.

Original languageEnglish
Pages (from-to)19-51
Number of pages33
JournalProgress in Surface Science
Volume72
Issue number1-4
DOIs
Publication statusPublished - 2003 Jun

Keywords

  • Electron diffraction
  • Semiconductor
  • Silicon
  • Surface structure
  • Thermal diffuse scattering

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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