Self-aligned periodic Ni nano dots embedded in nano-oxide layer

M. Doi, M. Izumi, S. Kawasaki, K. Miyake, M. Sahashi

Research output: Contribution to journalArticlepeer-review

Abstract

The Ni nano constriction dots embedded in the Ta-nano-oxide layer (NOL) was prepared by the ion beam sputtering (IBS) method. After the various conditions of the oxidations, the structural analyses of the NOL were performed by RHEED, AES and in situ STM/AFM observations. From the current image of the conductive AFM for NOL, the periodically aligned metallic dots with the size around 5-10 nm were successfully observed. The mechanism of the formation of the self-organized aligned Ni nano constriction dots is discussed from the standpoint of the grain size, the crystal orientation, the preferred oxidation of Ta at the diffused interface.

Original languageEnglish
Pages (from-to)e836-e837
JournalJournal of Magnetism and Magnetic Materials
Volume310
Issue number2 SUPPL. PART 3
DOIs
Publication statusPublished - 2007 Mar 1

Keywords

  • Magnetoresistance
  • Nano dot
  • Nano-oxide layer
  • Self-alined structure
  • Surface structure

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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