Abstract
We present a selected area nanodiffraction fluctuation electron microscopy (FEM) technique implemented on a conventional transmission electron microscope. Nanodiffraction patterns from a Pd-based metallic glass, collected using a selected area aperture 15 × 15 nm in effective size, display inhomogeneous speckling due to the small volume sampled. We compare the azimuthal intensity variance from these patterns to the spatial intensity variance from tilted dark-field measurements on the same specimens and find reasonable qualitative agreement, including features characteristic of medium-range order.
Original language | English |
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Pages (from-to) | 303-306 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 58 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2008 Feb |
Keywords
- Amorphous materials
- Electron diffraction
- Fluctuation electron microscopy
- Metallic glasses
- Nanostructure
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys