Selected area nanodiffraction fluctuation electron microscopy for studying structural order in amorphous solids

S. O. Hruszkewycz; T. Fujita; Mingwei W. Chen; Todd C. Hufnagel

doi:10.1016/j.scriptamat.2007.10.009

Selected area nanodiffraction fluctuation electron microscopy for studying structural order in amorphous solids

S. O. Hruszkewycz, T. Fujita, Mingwei W. Chen, Todd C. Hufnagel

Advanced Institute for Materials Research (AIMR)

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

We present a selected area nanodiffraction fluctuation electron microscopy (FEM) technique implemented on a conventional transmission electron microscope. Nanodiffraction patterns from a Pd-based metallic glass, collected using a selected area aperture 15 × 15 nm in effective size, display inhomogeneous speckling due to the small volume sampled. We compare the azimuthal intensity variance from these patterns to the spatial intensity variance from tilted dark-field measurements on the same specimens and find reasonable qualitative agreement, including features characteristic of medium-range order.

Original language	English
Pages (from-to)	303-306
Number of pages	4
Journal	Scripta Materialia
Volume	58
Issue number	4
DOIs	https://doi.org/10.1016/j.scriptamat.2007.10.009
Publication status	Published - 2008 Feb

Keywords

Amorphous materials
Electron diffraction
Fluctuation electron microscopy
Metallic glasses
Nanostructure

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

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10.1016/j.scriptamat.2007.10.009

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Hruszkewycz, S. O., Fujita, T., Chen, M. W., & Hufnagel, T. C. (2008). Selected area nanodiffraction fluctuation electron microscopy for studying structural order in amorphous solids. Scripta Materialia, 58(4), 303-306. https://doi.org/10.1016/j.scriptamat.2007.10.009

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AB - We present a selected area nanodiffraction fluctuation electron microscopy (FEM) technique implemented on a conventional transmission electron microscope. Nanodiffraction patterns from a Pd-based metallic glass, collected using a selected area aperture 15 × 15 nm in effective size, display inhomogeneous speckling due to the small volume sampled. We compare the azimuthal intensity variance from these patterns to the spatial intensity variance from tilted dark-field measurements on the same specimens and find reasonable qualitative agreement, including features characteristic of medium-range order.

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KW - Fluctuation electron microscopy

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