Selected area nanodiffraction fluctuation electron microscopy for studying structural order in amorphous solids

S. O. Hruszkewycz, T. Fujita, Mingwei W. Chen, Todd C. Hufnagel

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We present a selected area nanodiffraction fluctuation electron microscopy (FEM) technique implemented on a conventional transmission electron microscope. Nanodiffraction patterns from a Pd-based metallic glass, collected using a selected area aperture 15 × 15 nm in effective size, display inhomogeneous speckling due to the small volume sampled. We compare the azimuthal intensity variance from these patterns to the spatial intensity variance from tilted dark-field measurements on the same specimens and find reasonable qualitative agreement, including features characteristic of medium-range order.

Original languageEnglish
Pages (from-to)303-306
Number of pages4
JournalScripta Materialia
Volume58
Issue number4
DOIs
Publication statusPublished - 2008 Feb

Keywords

  • Amorphous materials
  • Electron diffraction
  • Fluctuation electron microscopy
  • Metallic glasses
  • Nanostructure

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

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