Scanning tunnelling spectroscopy of dangling-bond wires fabricated on the Si.100/-2×1-Hsurface

Taro Hitosugi, T. Hashizume, S. Heike, Y. Wada, S. Watanabe, T. Hasegawa, K. Kitazawa

    Research output: Contribution to journalArticlepeer-review

    12 Citations (Scopus)

    Abstract

    The scanning tunnelling microscopy/spectroscopy (STM/STS) of atomic-scale dangling-bond (DB) wires on a hydrogen-terminated Si.100/-2×1-H surface is studied. A single DB and a paired DB on a Si dimer, fabricated by extracting hydrogen atoms from the hydrogen-terminated Si surface, are distinguished by STM and the DB wires are categorized into several types. In the case of DB wires made of paired DBs, the STS shows semiconductive electronic states with a band gap of approximately 0:5 eV. The DB wires made of both single and paired DBs show a finite density of states at Fermi energy and do not show semiconductive band gaps. The results are in good agreement with recent " firstprinciples" theoretical calculations.

    Original languageEnglish
    Pages (from-to)S695-S699
    JournalApplied Physics A: Materials Science and Processing
    Volume66
    Issue numberSUPPL. 1
    DOIs
    Publication statusPublished - 1998

    ASJC Scopus subject areas

    • Chemistry(all)
    • Materials Science(all)

    Fingerprint

    Dive into the research topics of 'Scanning tunnelling spectroscopy of dangling-bond wires fabricated on the Si.100/-2×1-Hsurface'. Together they form a unique fingerprint.

    Cite this