Scanning tunnelling microscope combined with synchrotron radiation for element specific analysis

Taichi Okuda, Toyoaki Eguchi, Takeshi Matsushima, Masayuki Hamada, Xiao Dong Ma, Akira Kataoka, Ayumi Harasawa, Toyohiko Kinoshita, Yukio Hasewgawa

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


Scanning tunnelling microscopy (STM) combined with synchrotron radiation (SR) has been developed. By means of detecting the photoelectrons excited by the SR light with an STM tip, X-ray absorption spectrum (XAS) of the sample surface was successfully obtained during the STM observation. The results suggest the possibilities of the element specific surface analysis by an STM with a microscopic spatial resolution. Several trials for estimating and improving the spatial resolution of the XAS measurement are now undergoing.

Original languageEnglish
Pages (from-to)1157-1161
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Publication statusPublished - 2005 Jun
Externally publishedYes


  • Chemical reaction observation
  • Element specific
  • Scanning tunnelling microscope
  • Synchrotron radiation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry


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