Scanning tunneling microscopy investigation of single electron tunneling in Co-Al-O and Cu-Al-O granular films

K. Takanashi, S. Mitani, J. Chiba, H. Fujimori

Research output: Contribution to journalConference articlepeer-review

13 Citations (Scopus)

Abstract

We have investigated single electron tunneling in Co-Al-O and Cu-Al-O granular films using scanning tunneling microscopy (STM). Topographic images show well-defined granular structures where nanometer-sized metal granules are embedded in insulating matrix. The Coulomb staircases in the current-voltage (I-V) curves are clearly observed even at room temperature in both films. For the Co-Al-O film, furthermore, negative differential conductance appears in the Coulomb staircase.

Original languageEnglish
Pages (from-to)6331-6333
Number of pages3
JournalJournal of Applied Physics
Volume87
Issue number9 III
DOIs
Publication statusPublished - 2000 May 1
Event44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States
Duration: 1999 Nov 151999 Nov 18

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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