Abstract
We investigate the electronic properties of c(3√2×√2) R45°-C-reconstructed Cr(001) thin-film surfaces by scanning tunneling microscopy and spectroscopy (STM/STS). We previously observed that c(3√2x√5)R45°-C/Cr(001) thin-film surfaces yield two types of STM image, line structures along the Cr〈110〈 direction and an atomically resolved image, and discussed interpretations of the STM images in detail in a previous paper [Jpn. J. Appl. Phys. 46 (2007) 5602]. Here, STM measurements reveal that the top and bottom sites of the line structures correspond to the Cr atoms within and between C zigzag chains in the atomically resolved STM image, respectively. An STS study indicates that dI/dV spectra taken on the top and bottom sites show a single peak at +0.15eV and a main peak at +0.15eV with a shoulder at +0.32 eV, respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 6099-6101 |
| Number of pages | 3 |
| Journal | Japanese journal of applied physics |
| Volume | 47 |
| Issue number | 7 PART 3 |
| DOIs | |
| Publication status | Published - 2008 Jul 18 |
| Externally published | Yes |
Keywords
- Carbon
- Cr(001)
- DI/dV
- STM
- STS
- Superstructure
- Surface state
- c(3√2×√2)R45°
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)