Scanning tunneling microscopy and spectroscopy on c(3√2×√ 2)R45°-C-reconstructed Cr(001) thin-film surfaces

Hirofumi Oka, Kazuhisa Sueoka

Research output: Contribution to journalArticle

Abstract

We investigate the electronic properties of c(3√2×√2) R45°-C-reconstructed Cr(001) thin-film surfaces by scanning tunneling microscopy and spectroscopy (STM/STS). We previously observed that c(3√2x√5)R45°-C/Cr(001) thin-film surfaces yield two types of STM image, line structures along the Cr〈110〈 direction and an atomically resolved image, and discussed interpretations of the STM images in detail in a previous paper [Jpn. J. Appl. Phys. 46 (2007) 5602]. Here, STM measurements reveal that the top and bottom sites of the line structures correspond to the Cr atoms within and between C zigzag chains in the atomically resolved STM image, respectively. An STS study indicates that dI/dV spectra taken on the top and bottom sites show a single peak at +0.15eV and a main peak at +0.15eV with a shoulder at +0.32 eV, respectively.

Original languageEnglish
Pages (from-to)6099-6101
Number of pages3
JournalJapanese journal of applied physics
Volume47
Issue number7 PART 3
DOIs
Publication statusPublished - 2008 Jul 18
Externally publishedYes

Keywords

  • Carbon
  • Cr(001)
  • DI/dV
  • STM
  • STS
  • Superstructure
  • Surface state
  • c(3√2×√2)R45°

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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