Scanning tunneling microscope light emission spectroscopy with good signal-to-noise ratio

Yoichi Uehara, Sukekatsu Ushioda

Research output: Contribution to journalReview article

Abstract

Scanning tunneling microscope (STM) light emission spectroscopy provides a powerful tool for characterization of individual nanometer scale structures on solid surfaces. However, the light to be detected is usually very weak. It is desirable to improve the intensity level for measurements with good signal-to-noise ratio. For this purpose the role that the STM tip-sample gap plays in the light emission is analyzed by the dielectric theory of STM light emission. Based on the theoretical predictions, we discuss how one can obtain strong STM light emission and problems associated with the enhancement of emission.

Original languageEnglish
Pages (from-to)796-800
Number of pages5
JournalShinku/Journal of the Vacuum Society of Japan
Volume51
Issue number12
DOIs
Publication statusPublished - 2008 Jan 1

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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