Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

N. R. Lugg, S. D. Findlay, N. Shibata, T. Mizoguchi, A. J. D'Alfonso, L. J. Allen, Y. Ikuhara

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.

Original languageEnglish
Pages (from-to)999-1013
Number of pages15
JournalUltramicroscopy
Volume111
Issue number8
DOIs
Publication statusPublished - 2011 Jul
Externally publishedYes

Keywords

  • Annular bright field (ABF)
  • Electron energy-loss spectroscopy (EELS)
  • High-angle annular dark field (HAADF)
  • Low accelerating voltages
  • Scanning transmission electron microscopy (STEM)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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