TY - JOUR
T1 - Scanning transmission electron microscopy imaging dynamics at low accelerating voltages
AU - Lugg, N. R.
AU - Findlay, S. D.
AU - Shibata, N.
AU - Mizoguchi, T.
AU - D'Alfonso, A. J.
AU - Allen, L. J.
AU - Ikuhara, Y.
N1 - Funding Information:
N.R.L. acknowledges support received from the University of Melbourne Postgraduate Overseas Research Experience Scholarship scheme, the Australian Research Network for Advanced Materials and the Australian Research Council. N.S. acknowledges supports from PRESTO, Japan Science and Technology Agency, and from New Energy and Industrial Technology Development Organization (NEDO). L.J.A. acknowledges support from the Australian Research Council. This work was supported in part by the Grant-in-Aid for Scientific Research on Priority Areas “Nano Materials Science for Atomic-scale Modification 474” from the Ministry of Education, Culture, Sports and Technology (MEXT) of Japan.
PY - 2011/7
Y1 - 2011/7
N2 - Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.
AB - Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.
KW - Annular bright field (ABF)
KW - Electron energy-loss spectroscopy (EELS)
KW - High-angle annular dark field (HAADF)
KW - Low accelerating voltages
KW - Scanning transmission electron microscopy (STEM)
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U2 - 10.1016/j.ultramic.2011.02.009
DO - 10.1016/j.ultramic.2011.02.009
M3 - Article
C2 - 21740863
AN - SCOPUS:79959937889
VL - 111
SP - 999
EP - 1013
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
IS - 8
ER -