Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

N. R. Lugg; S. D. Findlay; N. Shibata; T. Mizoguchi; A. J. D'Alfonso; L. J. Allen; Y. Ikuhara

doi:10.1016/j.ultramic.2011.02.009

Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

N. R. Lugg, S. D. Findlay, N. Shibata, T. Mizoguchi, A. J. D'Alfonso, L. J. Allen, Y. Ikuhara

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.

Original language	English
Pages (from-to)	999-1013
Number of pages	15
Journal	Ultramicroscopy
Volume	111
Issue number	8
DOIs	https://doi.org/10.1016/j.ultramic.2011.02.009
Publication status	Published - 2011 Jul

Keywords

Annular bright field (ABF)
Electron energy-loss spectroscopy (EELS)
High-angle annular dark field (HAADF)
Low accelerating voltages
Scanning transmission electron microscopy (STEM)

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/j.ultramic.2011.02.009

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Cite this

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title = "Scanning transmission electron microscopy imaging dynamics at low accelerating voltages",

abstract = "Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.",

keywords = "Annular bright field (ABF), Electron energy-loss spectroscopy (EELS), High-angle annular dark field (HAADF), Low accelerating voltages, Scanning transmission electron microscopy (STEM)",

author = "Lugg, {N. R.} and Findlay, {S. D.} and N. Shibata and T. Mizoguchi and D'Alfonso, {A. J.} and Allen, {L. J.} and Y. Ikuhara",

year = "2011",

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AU - Lugg, N. R.

AU - Findlay, S. D.

AU - Shibata, N.

AU - Mizoguchi, T.

AU - D'Alfonso, A. J.

AU - Allen, L. J.

AU - Ikuhara, Y.

PY - 2011/7

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N2 - Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.

AB - Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.

KW - Annular bright field (ABF)

KW - Electron energy-loss spectroscopy (EELS)

KW - High-angle annular dark field (HAADF)

KW - Low accelerating voltages

KW - Scanning transmission electron microscopy (STEM)

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