Scanning Probe Microscopy

Ken Nakajima; Koji Sumitomo; Tomonobu Nakayama; Fukui Ken-Ichi Fukui; Masami Kageshima; Shigeki Kawai; Tadahiro Komeda; Takuji Takahashi; Takayuki Uchihashi

doi:10.35848/1347-4065/ac7cc6

Scanning Probe Microscopy

Ken Nakajima, Koji Sumitomo, Tomonobu Nakayama, Fukui Ken-Ichi Fukui, Masami Kageshima, Shigeki Kawai, Tadahiro Komeda, Takuji Takahashi, Takayuki Uchihashi

Division of Measurements

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	SL0001
Journal	Japanese journal of applied physics
Volume	61
Issue number	SL
DOIs	https://doi.org/10.35848/1347-4065/ac7cc6
Publication status	Published - 2022 Sept 1

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.35848/1347-4065/ac7cc6

Cite this

@article{5de437315ed747d184fac55e482cf601,

title = "Scanning Probe Microscopy",

author = "Ken Nakajima and Koji Sumitomo and Tomonobu Nakayama and {Ken-Ichi Fukui}, Fukui and Masami Kageshima and Shigeki Kawai and Tadahiro Komeda and Takuji Takahashi and Takayuki Uchihashi",

year = "2022",

month = sep,

day = "1",

doi = "10.35848/1347-4065/ac7cc6",

language = "English",

volume = "61",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "SL",

}

TY - JOUR

T1 - Scanning Probe Microscopy

AU - Nakajima, Ken

AU - Sumitomo, Koji

AU - Nakayama, Tomonobu

AU - Ken-Ichi Fukui, Fukui

AU - Kageshima, Masami

AU - Kawai, Shigeki

AU - Komeda, Tadahiro

AU - Takahashi, Takuji

AU - Uchihashi, Takayuki

PY - 2022/9/1

Y1 - 2022/9/1

UR - http://www.scopus.com/inward/record.url?scp=85134753124&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85134753124&partnerID=8YFLogxK

U2 - 10.35848/1347-4065/ac7cc6

DO - 10.35848/1347-4065/ac7cc6

M3 - Editorial

AN - SCOPUS:85134753124

SN - 0021-4922

VL - 61

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - SL

M1 - SL0001

ER -

Scanning Probe Microscopy

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this