Scanning probe microscopy

Takuji Takahashi; Ken Ichi Fukui; Masami Kageshima; Tadahiro Komeda; Ken Nakajima; Tomonobu Nakayama; Koji Sumitomo; Takayuki Uchihashi

doi:10.7567/JJAP.56.08L001

Scanning probe microscopy

Takuji Takahashi, Ken Ichi Fukui, Masami Kageshima, Tadahiro Komeda, Ken Nakajima, Tomonobu Nakayama, Koji Sumitomo, Takayuki Uchihashi

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	08L001
Journal	Japanese journal of applied physics
Volume	56
Issue number	8
DOIs	https://doi.org/10.7567/JJAP.56.08L001
Publication status	Published - 2017 Aug

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.7567/JJAP.56.08L001

Cite this

@article{6d610bc391c746d2a351daf5b4f06979,

title = "Scanning probe microscopy",

author = "Takuji Takahashi and Fukui, {Ken Ichi} and Masami Kageshima and Tadahiro Komeda and Ken Nakajima and Tomonobu Nakayama and Koji Sumitomo and Takayuki Uchihashi",

year = "2017",

month = aug,

doi = "10.7567/JJAP.56.08L001",

language = "English",

volume = "56",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "8",

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TY - JOUR

T1 - Scanning probe microscopy

AU - Takahashi, Takuji

AU - Fukui, Ken Ichi

AU - Kageshima, Masami

AU - Komeda, Tadahiro

AU - Nakajima, Ken

AU - Nakayama, Tomonobu

AU - Sumitomo, Koji

AU - Uchihashi, Takayuki

PY - 2017/8

Y1 - 2017/8

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U2 - 10.7567/JJAP.56.08L001

DO - 10.7567/JJAP.56.08L001

M3 - Editorial

AN - SCOPUS:85026901620

VL - 56

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 8

M1 - 08L001

ER -

Scanning probe microscopy

ASJC Scopus subject areas

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