Scanning probe microscopy

Masami Kageshima, Ken Ichi Fukui, Tadahiro Komeda, Ken Nakajima, Tomonobu Nakayama, Koji Sumitomo, Takuji Takahashi, Takayuki Uchihashi

Research output: Contribution to journalEditorial

Original languageEnglish
Article number08L001
JournalJapanese journal of applied physics
Volume54
Issue number8
DOIs
Publication statusPublished - 2015 Aug 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Kageshima, M., Fukui, K. I., Komeda, T., Nakajima, K., Nakayama, T., Sumitomo, K., Takahashi, T., & Uchihashi, T. (2015). Scanning probe microscopy. Japanese journal of applied physics, 54(8), [08L001]. https://doi.org/10.7567/JJAP.54.08L001