Scanning probe microscopes go video rate and beyond

M. J. Rost; L. Crama; P. Schakel; E. Van Tol; G. B.E.M. Van Velzen-Williams; C. F. Overgauw; H. Ter Horst; H. Dekker; B. Okhuijsen; M. Seynen; A. Vijftigschild; P. Han; A. J. Katan; K. Schoots; R. Schumm; W. Van Loo; T. H. Oosterkamp; J. W.M. Frenken

doi:10.1063/1.1915288

Scanning probe microscopes go video rate and beyond

M. J. Rost, L. Crama, P. Schakel, E. Van Tol, G. B.E.M. Van Velzen-Williams, C. F. Overgauw, H. Ter Horst, H. Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A. J. Katan, K. Schoots, R. Schumm, W. Van Loo, T. H. Oosterkamp, J. W.M. Frenken

Research output: Contribution to journal › Article › peer-review

173 Citations (Scopus)

Abstract

The features of video rate control system which can be used with any type of scanning probe microscope (SPM) are discussed. SPM control system was developed that allows high-speed scanning and data acquisition. This control system can be used for initial high tip-speed observation with existing variable temperature ultrahigh vacuum. A hybrid mode between the constant-height and constant-current modes were implemented for scanning tunneling microscopy (STM) application. It was observed that using scanner, video rate imaging speeds could reach upto 200 frames/s.

Original language	English
Article number	053710
Journal	Review of Scientific Instruments
Volume	76
Issue number	5
DOIs	https://doi.org/10.1063/1.1915288
Publication status	Published - 2005 May
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1915288

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Rost, M. J., Crama, L., Schakel, P., Van Tol, E., Van Velzen-Williams, G. B. E. M., Overgauw, C. F., Ter Horst, H., Dekker, H., Okhuijsen, B., Seynen, M., Vijftigschild, A., Han, P., Katan, A. J., Schoots, K., Schumm, R., Van Loo, W., Oosterkamp, T. H., & Frenken, J. W. M. (2005). Scanning probe microscopes go video rate and beyond. Review of Scientific Instruments, 76(5), [053710]. https://doi.org/10.1063/1.1915288

Scanning probe microscopes go video rate and beyond. / Rost, M. J.; Crama, L.; Schakel, P.; Van Tol, E.; Van Velzen-Williams, G. B.E.M.; Overgauw, C. F.; Ter Horst, H.; Dekker, H.; Okhuijsen, B.; Seynen, M.; Vijftigschild, A.; Han, P.; Katan, A. J.; Schoots, K.; Schumm, R.; Van Loo, W.; Oosterkamp, T. H.; Frenken, J. W.M.

In: Review of Scientific Instruments, Vol. 76, No. 5, 053710, 05.2005.

Research output: Contribution to journal › Article › peer-review

Rost, MJ, Crama, L, Schakel, P, Van Tol, E, Van Velzen-Williams, GBEM, Overgauw, CF, Ter Horst, H, Dekker, H, Okhuijsen, B, Seynen, M, Vijftigschild, A, Han, P, Katan, AJ, Schoots, K, Schumm, R, Van Loo, W, Oosterkamp, TH & Frenken, JWM 2005, 'Scanning probe microscopes go video rate and beyond', Review of Scientific Instruments, vol. 76, no. 5, 053710. https://doi.org/10.1063/1.1915288

Rost, M. J. ; Crama, L. ; Schakel, P. ; Van Tol, E. ; Van Velzen-Williams, G. B.E.M. ; Overgauw, C. F. ; Ter Horst, H. ; Dekker, H. ; Okhuijsen, B. ; Seynen, M. ; Vijftigschild, A. ; Han, P. ; Katan, A. J. ; Schoots, K. ; Schumm, R. ; Van Loo, W. ; Oosterkamp, T. H. ; Frenken, J. W.M. / Scanning probe microscopes go video rate and beyond. In: Review of Scientific Instruments. 2005 ; Vol. 76, No. 5.

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abstract = "The features of video rate control system which can be used with any type of scanning probe microscope (SPM) are discussed. SPM control system was developed that allows high-speed scanning and data acquisition. This control system can be used for initial high tip-speed observation with existing variable temperature ultrahigh vacuum. A hybrid mode between the constant-height and constant-current modes were implemented for scanning tunneling microscopy (STM) application. It was observed that using scanner, video rate imaging speeds could reach upto 200 frames/s.",

author = "Rost, {M. J.} and L. Crama and P. Schakel and {Van Tol}, E. and {Van Velzen-Williams}, {G. B.E.M.} and Overgauw, {C. F.} and {Ter Horst}, H. and H. Dekker and B. Okhuijsen and M. Seynen and A. Vijftigschild and P. Han and Katan, {A. J.} and K. Schoots and R. Schumm and {Van Loo}, W. and Oosterkamp, {T. H.} and Frenken, {J. W.M.}",

note = "Funding Information: This work is part of the research program of the Foundation for Fundamental Research on Matter (FOM) and was made possible by financial support from the Netherlands Organization for the Advancement of Research (NWO). T.H.O. acknowledges support from NWO, HFSP, and EU-FP6 (ASPRINT). ",

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AU - Schakel, P.

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AU - Van Velzen-Williams, G. B.E.M.

AU - Overgauw, C. F.

AU - Ter Horst, H.

AU - Dekker, H.

AU - Okhuijsen, B.

AU - Seynen, M.

AU - Vijftigschild, A.

AU - Han, P.

AU - Katan, A. J.

AU - Schoots, K.

AU - Schumm, R.

AU - Van Loo, W.

AU - Oosterkamp, T. H.

AU - Frenken, J. W.M.

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Scanning probe microscopes go video rate and beyond

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