Scanning nonlinear dielectric microscopy with nanometer resolution

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura, Hiroyuki Odagawa

Research output: Contribution to conferencePaperpeer-review

Abstract

A very high-resolution scanning nonlinear dielectric microscope with nanometer resolution was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal and of the domains in PZT and SBT thin films. Especially in a film measurement, the resolution was sub-nanometer order. Next, we also demonstrate that the resolution of SNDM is higher than that of a conventional piezo-response imaging. Finally, to check the performance of the SNDM system as a ferroelectric recording system, we conducted a fundamental study on the writing of domain inversion dot in PZT thin film and succeeded to have a very small domain dots with the size of 25 nm.

Original languageEnglish
Pages279-282
Number of pages4
Publication statusPublished - 2000 Dec 1
Event12th IEEE International Symposium on Applications of Ferroelectrics - Honolulu, HI, United States
Duration: 2000 Jul 212000 Aug 2

Other

Other12th IEEE International Symposium on Applications of Ferroelectrics
CountryUnited States
CityHonolulu, HI
Period00/7/2100/8/2

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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