Scanning nonlinear dielectric microscopy with nanometer resolution

Yasuo Cho; Satoshi Kazuta; Kaori Matsuura

doi:10.1063/1.125165

Scanning nonlinear dielectric microscopy with nanometer resolution

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura

Information Devices Division

Research output: Contribution to journal › Article › peer-review

172 Citations (Scopus)

Abstract

A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO₃ single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.

Original language	English
Pages (from-to)	2833-2835
Number of pages	3
Journal	Applied Physics Letters
Volume	75
Issue number	18
DOIs	https://doi.org/10.1063/1.125165
Publication status	Published - 1999 Nov 1

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.",

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N2 - A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.

AB - A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.

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Scanning nonlinear dielectric microscopy with nanometer resolution

Abstract

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