Scanning nonlinear dielectric microscopy with nanometer resolution

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura

Research output: Contribution to journalArticlepeer-review

175 Citations (Scopus)


A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.

Original languageEnglish
Pages (from-to)2833-2835
Number of pages3
JournalApplied Physics Letters
Issue number18
Publication statusPublished - 1999 Nov 1

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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