Abstract
A very high-resolution scanning nonlinear dielectric microscope was developed for the observation of ferroelectric polarization. We demonstrate that the resolution of the microscope is of a nanometer order by measurement of the c-c domain wall of a BaTiO3 single crystal, and that this microscope is very useful not only for the domain observation of ferroelectric bulk material but also for that of thin films.
| Original language | English |
|---|---|
| Pages (from-to) | 2833-2835 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 75 |
| Issue number | 18 |
| DOIs | |
| Publication status | Published - 1999 Nov 1 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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Cho, Y., Kazuta, S., & Matsuura, K. (1999). Scanning nonlinear dielectric microscopy with nanometer resolution. Applied Physics Letters, 75(18), 2833-2835. https://doi.org/10.1063/1.125165