Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains

Yasuo Cho; Satoshi Kazuta; Kaori Matsuura

doi:10.1143/jjap.38.5689

Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura

New Industry Creation Hatchery Center (NICHe)

Research output: Contribution to journal › Article › peer-review

28 Citations (Scopus)

Abstract

A new scanning nonlinear dielectric microscope with very high resolution for the observation of ferroelectric polarization was developed. This microscope has a newly developed contact sensing mechanism for detecting the exact contact point of a probe needle with respect to the surface of a specimen. This contact sensing mechanism enables us to use a probe needle with a very thin pointed end. Using the new microscope, domains in BaTiO₃ single crystal and in PbTiO₃ thin film were observed. By measuring the c-c domain wall of BaTiOs, the microscope was confirmed to have nanometer-order resolution.

Original language	English
Pages (from-to)	5689-5694
Number of pages	6
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	38
Issue number	9 B
DOIs	https://doi.org/10.1143/jjap.38.5689
Publication status	Published - 1999

Keywords

Contact sensing mechanism
Domain structure of BaTiOa single crystal
Ferroelectric materials
Nanometer-order resolution
Observation of domain in PbTiOs thin film
Scanning nonlinear dielectric microscope

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/jjap.38.5689

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Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains. / Cho, Yasuo; Kazuta, Satoshi; Matsuura, Kaori.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 38, No. 9 B, 1999, p. 5689-5694.

Research output: Contribution to journal › Article › peer-review

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abstract = "A new scanning nonlinear dielectric microscope with very high resolution for the observation of ferroelectric polarization was developed. This microscope has a newly developed contact sensing mechanism for detecting the exact contact point of a probe needle with respect to the surface of a specimen. This contact sensing mechanism enables us to use a probe needle with a very thin pointed end. Using the new microscope, domains in BaTiO3 single crystal and in PbTiO3 thin film were observed. By measuring the c-c domain wall of BaTiOs, the microscope was confirmed to have nanometer-order resolution.",

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Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains

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