Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura

Research output: Contribution to journalArticlepeer-review

27 Citations (Scopus)

Abstract

A new scanning nonlinear dielectric microscope with very high resolution for the observation of ferroelectric polarization was developed. This microscope has a newly developed contact sensing mechanism for detecting the exact contact point of a probe needle with respect to the surface of a specimen. This contact sensing mechanism enables us to use a probe needle with a very thin pointed end. Using the new microscope, domains in BaTiO3 single crystal and in PbTiO3 thin film were observed. By measuring the c-c domain wall of BaTiOs, the microscope was confirmed to have nanometer-order resolution.

Original languageEnglish
Pages (from-to)5689-5694
Number of pages6
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume38
Issue number9 B
DOIs
Publication statusPublished - 1999

Keywords

  • Contact sensing mechanism
  • Domain structure of BaTiOa single crystal
  • Ferroelectric materials
  • Nanometer-order resolution
  • Observation of domain in PbTiOs thin film
  • Scanning nonlinear dielectric microscope

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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