Scanning nonlinear dielectric microscopy -a high resolution tool for observing ferroelectric domains and nano-domain engineering

Yasuo Cho

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

A sub-nanometer resolution scanning nonlinear dielectric microscope (SNDM) was developed for the observation of ferroelectric polarization. We also demonstrate that the resolution of SNDM is higher than that of a conventional piezo-response imaging. Next, new report new SNDM technique detecting higher nonlinear dielectric constants ε3333, and ε 33333. It is expected that higher order nonlinear dielectric imaging will provide higher lateral and depth resolution. Moreover, a new type of scanning nonlinear dielectric microscope probe, called the ε311- type probe, and a system to measure the ferroelectric polarization component parallel to the surface is developed. Finally, the formation of artificial small inverted domain is reported to demonstrate that SNDM system is very useful as a nano-domain engineering tool. The nano-size domain dots were successfully formed in LiTaO3́ single crystal. This means that we can obtain a very high density ferroelectric data storage with the density above T-bits/inch 2.

Original languageEnglish
Pages (from-to)189-198
Number of pages10
JournalIntegrated Ferroelectrics
Volume50
DOIs
Publication statusPublished - 2002 Jan 1

Keywords

  • Ferroelectric data storage
  • Ferroelectric domain
  • Higher order nonlinear dielectric microscopy
  • Scanning nonlinear dielectric microscopy
  • Three-dimensional measurement

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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