Abstract
This article describes a new purely electrical technique for imaging the state of remanent polarization of a ferroelectric material by measuring the microscopic point-to-point variation of its nonlinear dielectric constants. First, the theory for detecting polarization is described. Secondly, the technique for measuring the nonlinear dielectric response is described. Finally, using this new microscope, area scans are obtained of the polarization domains in a periodically polarized and a multidomain lithium tantalate substrate, and of lead zirconate titanate ceramic and thin film.
| Original language | English |
|---|---|
| Pages | 435-438 |
| Number of pages | 4 |
| Publication status | Published - 1998 Dec 1 |
| Event | Proceedings of the 1998 11th IEEE International Symposium on Appliations of Ferroelectrics (ISAF-XI) - Montreaux, Switz Duration: 1998 Aug 24 → 1998 Aug 27 |
Other
| Other | Proceedings of the 1998 11th IEEE International Symposium on Appliations of Ferroelectrics (ISAF-XI) |
|---|---|
| City | Montreaux, Switz |
| Period | 98/8/24 → 98/8/27 |
ASJC Scopus subject areas
- Engineering(all)
- Materials Science(all)
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Cho, Y., Matsuura, K., & Yamanouchi, K. (1998). Scanning nonlinear dielectric microscope with submicron resolution. 435-438. Paper presented at Proceedings of the 1998 11th IEEE International Symposium on Appliations of Ferroelectrics (ISAF-XI), Montreaux, Switz, .