Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions

Yasuo Cho, Shigeyuki Atsumi, Kiyoshi Nakamura

Research output: Contribution to journalArticlepeer-review

66 Citations (Scopus)

Abstract

A new probe using a lumped constant resonator for the scanning nonlinear dielectric microscope has been developed. This probe has sufficient resolution to observe the area distribution of ferroelectric polarization. Using this probe, the distributions of the domains in the thin film of a copolymer of vinylidene fluoride and trifluoroethylene and in a lithium niobate substrate with a titanium-diffused inversion layer are observed.

Original languageEnglish
Pages (from-to)3152-3156
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume36
Issue number5 SUPPL. B
DOIs
Publication statusPublished - 1997 May
Externally publishedYes

Keywords

  • Lumped constant resonator probe
  • Scanning nonlinear dielectric microscope

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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