Scanning nonlinear dielectric microscope for investigation of polarization distributions

Yasuo Cho, Akio Kirihara

Research output: Contribution to conferencePaperpeer-review

Abstract

This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to-point variation of its nonlinear dielectric constants.

Original languageEnglish
Pages355-358
Number of pages4
Publication statusPublished - 1996 Dec 1
Externally publishedYes
EventProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA
Duration: 1996 Aug 181996 Aug 21

Other

OtherProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2)
CityEast Brunswick, NJ, USA
Period96/8/1896/8/21

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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