Scanning nonlinear dielectric microscope for investigation of ferroelectric domains

Yasuo Cho, Kazuhiko Yamanouchi

Research output: Contribution to journalArticlepeer-review

Abstract

This article describes a new purely electrical technique for imaging the state of remanent polarization of a ferroelectric material by measuring the microscopic point-to-point variation of its nonlinear dielectric constants. First, the theory for detecting polarization is described. Secondly, the technique for measuring the nonlinear dielectric response is described. Finally, using this new microscope, area scans are obtained of the polarization domains of lithium tantalate substrate with proton exchanged inversion layers, and of polarized and depolarized lead zirconate titanate ceramics.

Original languageEnglish
Pages (from-to)189-196
Number of pages8
JournalFerroelectrics
Volume222
Issue number1-4
DOIs
Publication statusPublished - 1999 Jan 1

Keywords

  • Ferroelectric domain
  • Scanning nonlinear dielectric microscope

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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