Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode

S. Akamine, Hiroki Kuwano, H. Yamada

Research output: Contribution to journalArticlepeer-review

44 Citations (Scopus)

Abstract

A combined atomic force and scanning near-field optical microscope is presented. The critical component of the instrument is a single crystal silicon, microfabricated force-sensing cantilever with an integrated photodiode. Near-field optical images are obtained by monitoring variations in the optical power detected by the photodiode while the cantilever tip is scanned in an evanescent optical field created by illuminating the sample by total internal reflection. Near-field optical power was detected at tip-sample spacings of one-quarter wavelength. Atomic force and scanning near-field optical microscope images of the same samples show corresponding features as small as 25 nm.

Original languageEnglish
Pages (from-to)579-581
Number of pages3
JournalApplied Physics Letters
Volume68
Issue number5
DOIs
Publication statusPublished - 1996 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode'. Together they form a unique fingerprint.

Cite this