Scanning diamond probe and application to thermo-mechanical nanolithography

Joon Hyung Bae; Takahito Ono; Chihiro Konoma; Masayoshi Esashi

Scanning diamond probe and application to thermo-mechanical nanolithography

Joon Hyung Bae, Takahito Ono, Chihiro Konoma, Masayoshi Esashi

Research output: Contribution to conference › Paper › peer-review

Abstract

This paper describes the fabrication, evaluation and application of a boron-doped diamond micro-probe with an integrated resistive heater element. The diamond heater with a pyramidal tip, which is bridged at the end of two diamond beams, can be electrically heated by flowing a DC or AC current. The high thermal conductivity of the diamond base supporting the heater element allows a very quick thermal response of 0.45 μsec. The hard-wearing sharp diamond tip formed by silicon-lost mold technique shows excellent durability in contact operation with a sample. Demonstration of thermo-mechanical nanolithography with this heated probe exhibits line patterns with the feature size of 40 nm on a Polymethylmethacrylate (PMMA) film and transferred pits-pattern with the diameter of 230 nm and the pitch of 400 nm onto a silicon substrate.

Original language	English
Pages	24-27
Number of pages	4
Publication status	Published - 2003 Jul 23
Event	IEEE Sixteenth Annual International Conference on Micro Electro Mechanical Systems - Kyoto, Japan Duration: 2003 Jan 19 → 2003 Jan 23

Other

Other	IEEE Sixteenth Annual International Conference on Micro Electro Mechanical Systems
Country	Japan
City	Kyoto
Period	03/1/19 → 03/1/23

ASJC Scopus subject areas

Control and Systems Engineering
Mechanical Engineering
Electrical and Electronic Engineering

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Cite this

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title = "Scanning diamond probe and application to thermo-mechanical nanolithography",

abstract = "This paper describes the fabrication, evaluation and application of a boron-doped diamond micro-probe with an integrated resistive heater element. The diamond heater with a pyramidal tip, which is bridged at the end of two diamond beams, can be electrically heated by flowing a DC or AC current. The high thermal conductivity of the diamond base supporting the heater element allows a very quick thermal response of 0.45 μsec. The hard-wearing sharp diamond tip formed by silicon-lost mold technique shows excellent durability in contact operation with a sample. Demonstration of thermo-mechanical nanolithography with this heated probe exhibits line patterns with the feature size of 40 nm on a Polymethylmethacrylate (PMMA) film and transferred pits-pattern with the diameter of 230 nm and the pitch of 400 nm onto a silicon substrate.",

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year = "2003",

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AU - Bae, Joon Hyung

AU - Ono, Takahito

AU - Konoma, Chihiro

AU - Esashi, Masayoshi

PY - 2003/7/23

Y1 - 2003/7/23

N2 - This paper describes the fabrication, evaluation and application of a boron-doped diamond micro-probe with an integrated resistive heater element. The diamond heater with a pyramidal tip, which is bridged at the end of two diamond beams, can be electrically heated by flowing a DC or AC current. The high thermal conductivity of the diamond base supporting the heater element allows a very quick thermal response of 0.45 μsec. The hard-wearing sharp diamond tip formed by silicon-lost mold technique shows excellent durability in contact operation with a sample. Demonstration of thermo-mechanical nanolithography with this heated probe exhibits line patterns with the feature size of 40 nm on a Polymethylmethacrylate (PMMA) film and transferred pits-pattern with the diameter of 230 nm and the pitch of 400 nm onto a silicon substrate.

AB - This paper describes the fabrication, evaluation and application of a boron-doped diamond micro-probe with an integrated resistive heater element. The diamond heater with a pyramidal tip, which is bridged at the end of two diamond beams, can be electrically heated by flowing a DC or AC current. The high thermal conductivity of the diamond base supporting the heater element allows a very quick thermal response of 0.45 μsec. The hard-wearing sharp diamond tip formed by silicon-lost mold technique shows excellent durability in contact operation with a sample. Demonstration of thermo-mechanical nanolithography with this heated probe exhibits line patterns with the feature size of 40 nm on a Polymethylmethacrylate (PMMA) film and transferred pits-pattern with the diameter of 230 nm and the pitch of 400 nm onto a silicon substrate.

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