SAW substrate for duplexer with excellent temperature characteristics and large reflection coefficient realized by using flattened Si02 film and thick heavy metal film

Michio Kadota, Takeshi Nakao, Norio Taniguchi, Eiichi Takata, Masakazu Mimura, Kenji Nishiyama, Takuo Hada, Tomohisa Komura

Research output: Contribution to journalConference articlepeer-review

16 Citations (Scopus)

Abstract

Authors previously proposed a SAW PCS-duplexer with an excellent temperature coefficient of frequency (TCP) and a good frequency characteristic composed of a thick-SiO2/thin-Au-electrodes /LiIaO3 structure. However, a sheet resistance of thin Au electrode is large, compared with thick Al-electrode, so thin Au-electrode is not suitable for filters requiring low loss. Authors tried to use thick Cu electrodes with small resistance By flattening large convex portions on the SiO2 surface, a SAW substrate suitable for US-PCS duplexer with low insertion loss and an excellent TCF was realized.

Original languageEnglish
Article number4014910
Pages (from-to)382-385
Number of pages4
JournalIEEE MTT-S International Microwave Symposium Digest
DOIs
Publication statusPublished - 2006 Dec 1
Event2006 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA, United States
Duration: 2006 Jun 112006 Jun 16

Keywords

  • Cu electrode
  • Duplexer
  • Excellent TCF
  • Flattened SiO2
  • LiTaO3

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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