Roundness measurement using angle probes

I Ko, Eijiro Sato, Satoshi Kiyono

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)

Abstract

A new error-separation method using multiple angle probes is presented. This method can separate roundness error and spindle error from each other. The effectiveness of the new method is shown by comparing with the conventional displacement three-probe method.

Original languageEnglish
Pages (from-to)408-411
Number of pages4
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4222
DOIs
Publication statusPublished - 2000 Dec 1
EventProcess Control and Inspection for Industry - Beijing, China
Duration: 2000 Nov 82000 Nov 10

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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