Room-temperature photoluminescence lifetime for the near-band-edge emission of (000 1 ) p-type GaN fabricated by sequential ion-implantation of Mg and H

K. Shima, H. Iguchi, T. Narita, K. Kataoka, K. Kojima, A. Uedono, S. F. Chichibu

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24 Citations (Scopus)

Abstract

Photoluminescence (PL) spectra of (000 1 ) N-polar p-type GaN fabricated by using the sequential ion-implantation of Mg and H with subsequent high temperature annealing exhibited the near-band-edge (NBE) emission at 300 K. The longest PL lifetime (τ PL) for the NBE emission of the sample with Mg and H concentrations of 1 × 1019 and 2 × 1020 cm-3, respectively, annealed at 1230 °C was 18 ps at 300 K. This value is almost comparable to that of the (0001) Ga-polar p-type Mg-doped GaN (p-GaN:Mg) homoepitaxial film of the same Mg concentration. By correlating τ PL and the concentration of major vacancy-type defects quantified using positron annihilation spectroscopy, the electron capture-cross-section (σn) of the major nonradiative recombination centers (NRCs), namely, clusters of Ga vacancies (VGas) and N vacancies (VNs) such as (VGa)3(VN)3, is estimated at a few times 10-13 cm2. This σn value is also comparable to that of the major NRCs in p-GaN:Mg epilayers, namely, VGa(VN)2 or VGa(VN)3, although the clustering sizes of the defects are different. These σn values are commonly larger than the hole capture-cross-section (σp = 7 × 10-14 cm2) of the major NRCs, VGaVN divacancies, in n-type GaN.

Original languageEnglish
Article number191901
JournalApplied Physics Letters
Volume113
Issue number19
DOIs
Publication statusPublished - 2018 Nov 5

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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