Robust Single-Shot Spin Measurement with 99.5% Fidelity in a Quantum Dot Array

Takashi Nakajima, Matthieu R. Delbecq, Tomohiro Otsuka, Peter Stano, Shinichi Amaha, Jun Yoneda, Akito Noiri, Kento Kawasaki, Kenta Takeda, Giles Allison, Arne Ludwig, Andreas D. Wieck, Daniel Loss, Seigo Tarucha

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25 Citations (Scopus)

Abstract

We demonstrate a new method for projective single-shot measurement of two electron spin states (singlet versus triplet) in an array of gate-defined lateral quantum dots in GaAs. The measurement has very high fidelity and is robust with respect to electric and magnetic fluctuations in the environment. It exploits a long-lived metastable charge state, which increases both the contrast and the duration of the charge signal distinguishing the two measurement outcomes. This method allows us to evaluate the charge measurement error and the spin-to-charge conversion error separately. We specify conditions under which this method can be used, and project its general applicability to scalable quantum dot arrays in GaAs or silicon.

Original languageEnglish
Article number017701
JournalPhysical Review Letters
Volume119
Issue number1
DOIs
Publication statusPublished - 2017 Jul 6
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Nakajima, T., Delbecq, M. R., Otsuka, T., Stano, P., Amaha, S., Yoneda, J., Noiri, A., Kawasaki, K., Takeda, K., Allison, G., Ludwig, A., Wieck, A. D., Loss, D., & Tarucha, S. (2017). Robust Single-Shot Spin Measurement with 99.5% Fidelity in a Quantum Dot Array. Physical Review Letters, 119(1), [017701]. https://doi.org/10.1103/PhysRevLett.119.017701