Robust formation of skyrmions and topological hall effect anomaly in epitaxial thin films of MnSi

Yufan Li, N. Kanazawa, X. Z. Yu, A. Tsukazaki, M. Kawasaki, M. Ichikawa, X. F. Jin, F. Kagawa, Y. Tokura

Research output: Contribution to journalArticlepeer-review

213 Citations (Scopus)

Abstract

Magnetotransport properties have been investigated for epitaxial thin films of B20-type MnSi grown on Si(111) substrates. Lorentz transmission electron microscopy images clearly point to the robust formation of Skyrmions over a wide temperature-magnetic field region. New features distinct from those reported previously for MnSi are observed for epitaxial films: a shorter (nearly half) period of the spin helix and Skyrmions, and a topological Hall effect anomaly consisting in ∼2.2 times enhancement of the amplitude and in the opposite sign with respect to bulk samples.

Original languageEnglish
Article number117202
JournalPhysical review letters
Volume110
Issue number11
DOIs
Publication statusPublished - 2013 Mar 12
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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