Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

S. D. Findlay, N. Shibata, H. Sawada, E. Okunishi, Y. Kondo, T. Yamamoto, Y. Ikuhara

    Research output: Contribution to journalArticlepeer-review

    258 Citations (Scopus)

    Abstract

    We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics.

    Original languageEnglish
    Article number191913
    JournalApplied Physics Letters
    Volume95
    Issue number19
    DOIs
    Publication statusPublished - 2009

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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