@article{5b42b78455da450f8acda52d478e0397,
title = "Robust atomic resolution imaging of light elements using scanning transmission electron microscopy",
abstract = "We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics.",
author = "Findlay, {S. D.} and N. Shibata and H. Sawada and E. Okunishi and Y. Kondo and T. Yamamoto and Y. Ikuhara",
note = "Funding Information: This work was supported in part by the Grant-in-Aid for Scientific Research on Priority Areas “NanoMaterials Science for Atomic-scale Modification 474” (Grant No. 19053001) from the Ministry of Education, Culture, Sports, and Technology (MEXT) of Japan. N.S. acknowledges support from PRESTO, Japan Science and Technology Agency, and from New Energy and Industrial Technology Development Organization (NEDO). SDF. is supported by the Japan Society for the Promotion of Science (JSPS).",
year = "2009",
doi = "10.1063/1.3265946",
language = "English",
volume = "95",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "19",
}