RF thin-film permeability measurements in a travelling electromagnetic field

Yasunori Miyazawa, Masahiro Yamaguchi, Katsuji Kaminishi, Ken Ichi Arai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Thin film permeability measurements in the RF range gives useful information for materials science and modem IT device developments including cellular phone (0.8-2GHz) and bluetooth devices (2.45GHz). We propose a new permeameter utilizing traveling electromagnetic field mode and a shielded-loop type planar pickup coil. We measured the permeability profile of CoZnO using this permeameter.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
Publication statusPublished - 2002
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/TerritoryNetherlands
CityAmsterdam
Period02/4/2802/5/2

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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