RF thin-film permeability measurements in a travelling electromagnetic field

Yasunori Miyazawa, Masahiro Yamaguchi, Katsuji Kaminishi, Ken Ichi Arai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Thin film permeability measurements in the RF range gives useful information for materials science and modem IT device developments including cellular phone (0.8-2GHz) and bluetooth devices (2.45GHz). We propose a new permeameter utilizing traveling electromagnetic field mode and a shielded-loop type planar pickup coil. We measured the permeability profile of CoZnO using this permeameter.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
Publication statusPublished - 2002
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Other

Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
CountryNetherlands
CityAmsterdam
Period02/4/2802/5/2

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of 'RF thin-film permeability measurements in a travelling electromagnetic field'. Together they form a unique fingerprint.

Cite this