RF joule losses analysis in thin film noise suppressor estimated by 3-D equivalent circuit network

Sho Muroga, Masahiro Yamaguchi

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

This paper discusses the Joule losses in a thin film noise suppressor based on 3-D equivalent circuit network analysis and 3-D full wave electromagnetic field simulation. The thin film and transmission line is divided into number of elements in a plane perpendicular to surface of thin film. Each element is represented by four resistances in length and width direction and capacitors between conductors. Joule loss is quantitatively calculated as a function of sheet resistance using equivalent circuit network analysis. From this result it is successful by shown the Joule loss in thin film is a function of sheet resistance, not the intrinsic resistivity of the thin film or thickness as previous analyses. It is also shown that the Joule loss in the thin film is determined by the two major factors; the eddy current and conduction current deviated from the signal line in the form of displacement current. This result shows that the proposed equivalent circuits well explain the mechanism of the Joule losses in thin film.

Original languageEnglish
Article number5257154
Pages (from-to)4804-4807
Number of pages4
JournalIEEE Transactions on Magnetics
Volume45
Issue number10
DOIs
Publication statusPublished - 2009 Oct 1

Keywords

  • EMC
  • Eddy current losses
  • Electromagnetic noise suppressor
  • Equivalent circuits
  • Joule losses
  • Sheet resistance
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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