Abstract
By means of the elastic recoil detection (ERD) analysis technique, H and D concentration distributions in SiC single crystals implanted with 13 keV H+ and 10 keV D+ were measured. The profiles obtained were compared with simulated range profiles as well as defect distributions created during the implantation. The thermal release of D retained in the crystal was studied by isochronal annealing up to 1200 °C. The binding energy of D in SiC was estimated to be 4.0±0.2 eV.
Original language | English |
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Pages (from-to) | 760-763 |
Number of pages | 4 |
Journal | Journal of Nuclear Materials |
Volume | 128-129 |
Issue number | C |
DOIs | |
Publication status | Published - 1984 Jan 1 |
Keywords
- SiC
- deuterium
- hydrogen
- retention
- thermal release
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Materials Science(all)