Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy

Kazushi Yamanaka; Yoshiki Maruyama; Toshihiro Tsuji; Keiichi Nakamoto

doi:10.1063/1.1357540

Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy

Kazushi Yamanaka, Yoshiki Maruyama, Toshihiro Tsuji, Keiichi Nakamoto

ENG - Materials Processing

Research output: Contribution to journal › Article › peer-review

109 Citations (Scopus)

Abstract

We developed an improved ultrasonic atomic force microscopy (UAFM) for mapping resonance frequency and Q factor of a cantilever where the tip is in linear contact with the sample. Since the vibration amplitude at resonance is linearly proportional to the Q factor, the resonance frequency and Q factor are measured in the resonance tracking mode by scanning the sample in the constant force mode. This method enables much faster mapping of the resonance frequency and Q factor than the previous one using a network analyzer. In this letter, we describe the principle and instrumentation of the UAFM and show images of carbon-fiber-reinforced plastic composites.

Original language	English
Pages (from-to)	1939-1941
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	13
DOIs	https://doi.org/10.1063/1.1357540
Publication status	Published - 2001 Mar 26

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1357540

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AU - Yamanaka, Kazushi

AU - Maruyama, Yoshiki

AU - Tsuji, Toshihiro

AU - Nakamoto, Keiichi

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Y1 - 2001/3/26

N2 - We developed an improved ultrasonic atomic force microscopy (UAFM) for mapping resonance frequency and Q factor of a cantilever where the tip is in linear contact with the sample. Since the vibration amplitude at resonance is linearly proportional to the Q factor, the resonance frequency and Q factor are measured in the resonance tracking mode by scanning the sample in the constant force mode. This method enables much faster mapping of the resonance frequency and Q factor than the previous one using a network analyzer. In this letter, we describe the principle and instrumentation of the UAFM and show images of carbon-fiber-reinforced plastic composites.

AB - We developed an improved ultrasonic atomic force microscopy (UAFM) for mapping resonance frequency and Q factor of a cantilever where the tip is in linear contact with the sample. Since the vibration amplitude at resonance is linearly proportional to the Q factor, the resonance frequency and Q factor are measured in the resonance tracking mode by scanning the sample in the constant force mode. This method enables much faster mapping of the resonance frequency and Q factor than the previous one using a network analyzer. In this letter, we describe the principle and instrumentation of the UAFM and show images of carbon-fiber-reinforced plastic composites.

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Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy

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