Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy

Kazushi Yamanaka, Yoshiki Maruyama, Toshihiro Tsuji, Keiichi Nakamoto

Research output: Contribution to journalArticlepeer-review

106 Citations (Scopus)

Abstract

We developed an improved ultrasonic atomic force microscopy (UAFM) for mapping resonance frequency and Q factor of a cantilever where the tip is in linear contact with the sample. Since the vibration amplitude at resonance is linearly proportional to the Q factor, the resonance frequency and Q factor are measured in the resonance tracking mode by scanning the sample in the constant force mode. This method enables much faster mapping of the resonance frequency and Q factor than the previous one using a network analyzer. In this letter, we describe the principle and instrumentation of the UAFM and show images of carbon-fiber-reinforced plastic composites.

Original languageEnglish
Pages (from-to)1939-1941
Number of pages3
JournalApplied Physics Letters
Volume78
Issue number13
DOIs
Publication statusPublished - 2001 Mar 26

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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