Resolving 45 pm with 300 kV aberration corrected STEM

H. Sawada, N. Shimura, K. Satoh, E. Okunishi, F. Hosokawa, N. Shibata, Y. Ikuhara

    Research output: Contribution to journalConference articlepeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)124-125
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume20
    Issue number3
    DOIs
    Publication statusPublished - 2014 Aug 1
    EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
    Duration: 2014 Aug 32014 Aug 7

    ASJC Scopus subject areas

    • Instrumentation

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