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Resistive switching behaviors of ReRAM having W/CeO2/Si/TiN structures
C. Dou, K. Mukai, K. Kakushima, P. Ahmet, K. Tsutsui, A. Nishiyama, N. Sugii, K. Natori, T. Hattori, H. Iwai
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
Citations
(Scopus)